HIGH-PERFORMANCE OPTICAL MEASUREMENT EQUIPMENT AND SYSTEM SOLUTION

OPTICAL MEASUREMENT SYSTEM SOLUTION

EF/EAF MEASUREMENT SYSTEM

PRODUCT OVERVIEW
EF(Encircled flux)/EAF(Encircled Angular Flux) MEASUREMENT SYSTEM

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Encircled Flux (EF) and Encircled Angular Flux (EAF) Measurement System is to measure mode diffusion of GI type or SI type multimode optical fiber with the image analysis of NFP and FFP images.

EF/EAF measurement system equips NFP Measurement Optics M-Scope type S (M-Scope type L) for EF measurement, and FFP Measurement Optics M-Scope type F for EAF measurement. In combination with these optics, imaging detector and Synos' Optical Beam Analysis Module AP013, it is possible to measure and analyze EF/EAF and optical mode diffusion characteristic of GI/SI multimode optical fiber and optical device quickly and easily.

By selecting imaging detector, it will be applicable for optical beam profile observation and analysis in 400~1700nm spectral range, corresponding to the measurement wavelength and purpose.

ABOUT EF/EAF MEASUREMENT

SUMMARY

The loss of multimode fiber will vary depending on launch condition so that it is necessary to verify launch condition at the measurement. As a new method, EF (Encircled Flux)/EAF (Encircled angular flux) is used to define such launch condition. Especially, EF (Encircled Flux)/EAF (Encircled angular flux) plays an important role for high speed multimode transmission.

In general, EF (Encircled Flux) is applied for GI (Graded Index) type MMF, and EAF (Encircled Angular Flux) is applied for SI (Step Index) type MMF.

MEASUREMENT STANDARD OF IEC

As for corresponding to high speed transmission like 10Gbps etc., EF (Encircled Flux) measurement method is regulated as IEC61280-1-4 as regulation of new launch condition for GI MMF.

On the other hand, EAF (Encircled Angular Flux) measurement method is regulated as IEC61300-3-53 as regulation of new launch condition for SI MMF.

EF(ENCIRCLED FLUX) ANALYSIS

Encircled flux is a value obtained by integrating from the center toward the outer peripheral portion of the light intensity distribution of optical fiber edge. Against light intensity distribution of the entire optical mode, it is an indicator of what is a percentage on the intensity in the range from the center to radius(r) and is represented by the formula and graphs in the figure on the left side.

EF analysis is proceeded based on the NFP image data of fiber edge acquired by NFP measurement optics. About system component, please refer to SYSTEM COMPONENT SELECTION shown below.

EAF(Encircled Angular Flux) ANALYSIS

Encircled Angular flux is the integral value for the intensity distribution of the emission angle from the edge, from the center of angular spread to N.A. direction.

EAF analysis is proceeded based on the FFP image data from fiber acquired by FFP measurement optics. About system component, please refer to SYSTEM COMPONENT SELECTION shown below.

FEATURE

  • Easy to use and efficient EF/EAF measurement system by dedicated optics and image processing method.
    • Synos’ M-Scope type S, Sophisticated NFP Measurement Optics, is adopted as for EF (Encircled Flux) measurement optics.
      • Simplified NFP Measurement Optics M-Scope type L is also available.
    • Synos' M-Scope type F, FFP Measurement Optics, is adopted as for EAF (Encircled Angular Flux) measurement optics.
  • Possible to select suitable imaging detector in 400~1700nm spectral range
    • for 400~1100nm : High Resolution CMOS Detector ISA071/ISA071GL
    • for 950nm~1700nm : InGaAs High Sensitivity NIR Detector ISA041H2
    • 【NEW】for 400nm~1700nm : InGaAs High Resolution NIR Detector ISA041HRA
  • Synos' Optical Beam Analysis Module AP013, image processing, data aquisition and analysis system for optical beam analysis.
    • All-in-one package system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, sensor driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
    • Optometrics BA Standard, specially designed high-functional image processing software for optical beam profile analysis
      • Essential and useful functionality for NFP, FFP, beam profile analysis are equipped in Optometrics BA Standard.
      • EF/EAF analysis function is installed as standard function.
  • Special launch optical system is prepared as optional unit.
    • Underfilled Launch Optical System M-Scope type G : Possible to control launch condition such as N.A., diameter of input light
    • Mode-selective Launch Optical System M-Scope type ML : Possible to select specified angle (N.A.) component of launch light to the sample fibers

APPLICATION

  • Optical mode diffusion evaluation of GI (graded index) type / SI (step index) type MMF (multimode optical fiber)
  • Optical mode diffusion evaluation of POF (plastic optical fiber)
  • Optical mode diffusion evaluation of multimode optical device such as polymer optical waveguide for OPCB substrate etc.
  • NFP/FFP measurement of various optical fibers in general

SYSTEM COMPONENT SELECTION

SYSTEM CONFIGURATION DIAGRAM
ENCIRCLED FLUX MEASUREMENT SYSTEM
  • Optics bench for fiber sample measurement with manual stage
  • Sophisticated NFP Measurement Optics M-Scope type S
    • Option of M-Scope type S
      • Coaxial Epi-illumination Port MS-OP011-CEP
        • Coaxial epi-illumination port with removable half mirror.
      • LED coaxial epi-illumination system
        • About LED coaxial epi-illumination system selection, please refer to here.
      • Objective lens selection
        • About objective lens selection, please refer to here.
  • Detector selection
    • 400~1100nm : High Resolution CMOS Detector ISA071/ISA071GL
    • 950-1700nm : InGaAs High Sensitivity NIR Detector ISA041H2
    • 400~1700nm : 【NEW】InGaAs High Resolution NIR Detector ISA041HRA/ISA041HRVA
    • About optical sensor selection, please refer to here.
  • Optical Beam Analysis Module AP013
    • Personal Computer for data processing
    • Optical beam analysis software Optometrics BA Standard
    • Calibration data set for NFP measurement
    • Driver software for imaging detector
  • Accessories
    • Cables
    • Documents (instruction manuals, etc.)
ENCIRCLED ANGULAR FLUX MEASUREMENT SYSTEM
  • Optics bench for fiber sample measurement with manual stage
  • FFP Measurement Optics selection
  • Detector selection
    • 400~1100nm : High Resolution CMOS Detector ISA071/ISA071GL
    • 950-1700nm : InGaAs High Sensitivity NIR Detector ISA041H2
    • 400~1700nm : 【NEW】SXGA InGaAs High Resolution NIR Detector ISA041HRA
    • About optical sensor selection, please refer to here.
  • Optical Beam Analysis Module AP013
    • Personal Computer for data processing
    • Optical beam analysis software Optometrics BA Standard
    • Calibration data set for NFP measurement
    • Driver software for imaging detector
  • Accessories
    • Cables
    • Documents (instruction manuals, etc.)
COMMON OPTIONS・ACCESORIES
  • ND filter
    • for visible（400~700nm）：NDF-5
    • for NIR（700nm~1100nm）：NDF NIR-5
    • for IR（1310nm~1550nm）：NDF IR-5
      • About ND filter, please refer to here.
  • Special launch optical system
  • Measurement light source
    • Low Coherent 850nm SLD Light Source LSS002/850
    • FC Connector Output High Stability LD Light Source Unit LSL002 Series

OPTICAL BEAM ANALYSIS SOFTWARE Optometrics BA Standard
EF(Encircled Flux)/EAF(Encircled Angular Flux) ANALYSIS FUNCTION

Synos' Optical Beam analysis software has EF/EAF analysis function as standard function.

In addition to EF/EAF analysis and EF/EAF graph display function, it also has EF/EAF mask display function. It is also possible to output and save calculated EF/EAF data as csv data.

RELATED PRODUCT INFORMATION

  • Optical Beam NFP Measurement System
    • High functional NFP/beam profile measurement system by dedicated optics and image processing method.
  • FFP Measurement System
    • FFP measurement system by dedicated optics and image processing method
  • Optical Beam Analysis Module AP013
    • All-in-one package high functional optical beam profile analysis system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, detector driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
  • Special launch optical system
  • Measurement light source
    • Low Coherent 850nm SLD Light Source LSS002/850
    • FC Connector Output High Stability LD Light Source Unit LSL002 Series
  • In addition, we have a variety of optical measurement units and systems for various purposes and applications.

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