APPLCATION・TECHNICAL INFORMATION
APPLICATION AND TECHNICAL INFORMATION
APPLICATION AND TECHNICAL INFORMATION
In this site, we introduce information on applications such as measurement examples, application examples, and analysis examples by combining our various product groups.
In addition, technical information related to our products is posted.
APPLICATION AND TECHNICAL INFORMATION NEWS&TOPICS
NICALAPPLICATION AND TECHNICAL INFORMATION
APPLICATION / OPTICAL BEAM IRRADIATION AND DETECTION MEASUREMENT
| FILE No. | CONTENT | RELATED PRODUCT | |
|---|---|---|---|
| A-1 | To evaluate optical characteristics of optical semiconductor device (photo diode) (in preparation) |
M-Scope type I |
APPLICATION / OPTICAL BEAM PROFILE MEASUREMENT
| FILE No. | CONTENT | RELATED PRODUCT | |
|---|---|---|---|
| B-1 | To measure NFP of SMF (Single-mode optical fiber) for optical communication in NIR wavelength range. | NFP measurement system | |
| B-2 | To measure NFP of MMF (multi-mode fiber) using 850nm LD light source. | NFP measurement system | |
| B-3 | To measure EAF (encircled angular flux) of MMF (multi-mode optical fiber) under various launch condition using underfilled launch optical system. | EAF measurement system |
TECHNICAL INFORMATION
| FILE No. | CONTENT | RELATED PRODUCT | |
|---|---|---|---|
| C-1 | What is "optical method beam irradiation and detection measurement method? | M-Scope type I/type J/type M | |
| C-2 | Difference between underfilled launch and mode selective launch. | M-Scope type G/type ML |