IMAGING DETECTOR AND RELATED PRODUCT
SXGA InGaAs HIGH RESOLUTION SWIR DETECTOR ISA041HRA
PRODUCT OVERVIEW
SXGA InGaAs HIGH RESOLUTION SWIR DETECTOR ISA041HRA
ISA041HRA is a new type InGaAs SWIR detector using InGaAs high resolution solid state image sensor, having 400nm~1700nm wide spectral range.
As the image sensing device, pixel pitch 5μm square, 1280×1024 pixels high resolution type InGaAs solid state image sensor is used. Feastures high resolution and wide spectral sensitivity, it is suitable not only for optical beam profile measurement and observation but also for general purpose NIR image observation.
In combination with Synos’ optical system M-Scope series and Optical Beam Analysis Module AP013, it realizes various optical beam observation and analysis system in visible ~ NIR wide spectral range.
FEATURE
- High resolution InGaAs image sensor
- 1280(H)×1024(V) pixels, 5um × 5um pixel size, 15℃ chip temperature control
- Wide spectral sensitivity range of 400~1700nm.
- Superior characteristic of optical input-output linearity
- ISA041HRA has nearly linear signal output characteristic to optical input, therefore it is very suitable for optical intensity distribution measurement for laser beam measurement.
- Excellent durability to input light, superior property for image lag.
- ISA041HRA has almost no image lag, which makes it suitable for observation of quick movements such as position alignment and surveillance. In addition, it has almost no image burning that conventional infrared vidicon camera has.
- Easy set-up by using Gigabit Ethernet camera I/F
- ISA041HRA has Gigabit Ethernet camera I/F. It is easy to set up and use without special image processing hardware.
APPLICATIONS
- Laser beam observation and laser beam profile analysis in 400~1700nm spectral range.
- Laser diode, optical fiber, optical waveguide, optical modules for optical communication
- NFP, FFP, collimated beam measurement in 400~1700nm spectral range
- Encircled flux and Encircled Angular Flux analysis
- Optical characteristic measurement and assembly alignment for optical communication module such as fiber module and optical module
- Research and development of silicon photonics
- Inspection for semiconductor devices
- Si wafer, compound semiconductor wafer, solar cell device, semiconductor chip
- General purpose high resolution image observation in visible ~ NIR spectral range
SUMMARY OF SPECIFICATION
SPECTRAL SENSITIVITY
SUMMERY OF SPECIFICATION
| MAIN SPECIFICATIONS OF InGaAs SENSOR | |
|---|---|
| Sensor | InGaAs image sensor |
| Spectral range | 400~1700nm |
| Pixel number | 1280(H)×1024(V) (total 1310720 pixels) |
| Sensor pitch (pixel size) | 5μm × 5μm |
| Effective device size | 6.4mm(H) × 5.12mm(V) |
| MAIN SPECIFICATIONS OF DETECTOR UNIT | |
| Camera interface | Gigabit Ethernet (1000BASE-T) |
| ADC | 12bit / 8bit |
| Chip cooling temperature | +15℃ (peltier cooling setting temperature at) |
| Frame rate | 30.0 fps (12bit) |
| 60.0 fps (8bit) | |
| Exposure time | 6μsec ~ 10msec (6μsec ~ 9.99sec settable) |
| S/N ratio | 54dB |
| Camera mount | C mount |
| Power consumption | approx. 7W |
| Input voltage | DC +12V ~ 24V ±1V |
| Ambient operation temp. (recommended) | +25℃ +-3℃ |
| Ambient operation temperature/humidity | 0 ~ 45℃ / 20% ~ 80% (no condensation) |
| Ambient storage temperature/humidity | -15 ~ +65℃ / 20% ~ 80% (no condensation) |
COMPONENT
STANDARD COMPONENT
- Detector head : 1
- Camera adaptor : 1
- 12pin camera cable : 1
- LAN cable : 1