HIGH-PERFORMANCE OPTICAL MEASUREMENT EQUIPMENT AND SYSTEM SOLUTION

OPTICS AND OPTICAL MEASUREMENT INSTRUMENTS

SOPHISTICATED NFP MEASUREMENT OPTICS M-Scope type S

PRODUCT OVERVIEW

mscopetypes

M-Scope type S is a high performance optical system for NFP/optical beam profile measurement of laser diodes, optical fibers, optical waveguides, and various light emitting devices and modules, especially ideal for laser beam profiler in 400~1700nm wavelength range.

Equipped with manual revolver, you can easily change objective lens and select appropriate magnification. Additionally, with optional coaxial epi-illumination system for image observation, you can observe microscopic image such as fiber end face, waveguide end face, LD chip surface, outline appearance of lens module and so on.

With these sophisticated functionalities of M-Scope type S, it will be applicable from optical beam profile measurement to assembling adjustment of various optical modules. In combination with Optical Beam Analysis Module AP013 and various imaging detectors, it will be applicable for high-functional laser beam profiler and optical beam profile measurement in 400~1700nm spectral range. In addition, it will be also applicable to the encircled flux measurement and analysis. This function will be indispensable to understand optical characteristic of G.I. multimode fibers.

FEATURE

  • Equipping 4 hole manual revolver to switch multiple objective lens
  • Maximum 200 optical magnifications for evaluating minute spot.
    • Using optional 2x intermediate lens port MS-OP011-RL2 and 100× objective lens
  • In combination with optional coaxial epi-illumination system, it will be possible to observe real microscopic image observation and positioning.
  • By selecting imaging detector, it will be applicable for optical beam profile observation and analysis in 400~1700nm wavelength range
  • In combination with SYNOS' Optical Beam Analysis Module AP013, it will be applicable to various optical beam profile analysis application including EF (Encircled Flux) analysis.

APPLICATION

  • High functional laser beam profiler of various laser devices and modules in 400~1700nm wavelength range.
  • Optical beam NFP/beam profile observation and analysis of various optical devices and modules.
    • Laser diodes, laser devices, optical fibers, optical waveguides, and various optical devices and modules
  • R&D, evaluation of Si photonics devices
  • R&D, evaluation of polymer waveguides and optical connector for OPCB application
  • Encircled flux analysis of GI MMF
  • General purpose optical beam monitors and beam profile applications in 400~1700nm wavelength range

SUMMARY OF SPECIFICATION

MAIN SPECIFICATION OF THE OPTICS
Objective lens switching By manual revolver
Objective lens Mitutoyo M-Plan Apo series (standard)
Intermediate lens 1× (standard), 2×・1/2× (option)
Total magnification
  • standard ：100x (with a 100x objective lens)
  • option 200x (Using optional 2x intermediate magnification lens and 100× objective lens)
Coaxial epi-illumination option: coaxial epi-illumination port (for tip diameter φ8mm port light unit), coaxial epi-illumination system
Optical attenuation method by neutral density filters
Camera mount C mount
【REFERENCE DATA】MEASUREMENT VIEW AND PIXEL RESOLUTION (CALCULATED AMOUNT) IN COMBINATION WITH MAIN SENSORS AND OBJECTIVE LENSES
【DETECTOR SELECTION】CMOS Detector ISA071/ISA071GL, InGaAs NIR Detector ISA041H2
Imaging detector High Resolution CMOS Detector
ISA071, ISA071GL		 InGaAs High Sensitivity NIR Detector
ISA041H2
Spectral range 400-1100nm 950-1700nm
Effective pixels number 2048×1536 pixels 320×256 pixels
Pixel pitch 3.45μm 20μm
Sensor format 1/1.8" approx. 6.4ｍｍ×5.12mm (1/2")
Objective lens Intermediate lens Total magnification Measurement view Pixel resolution*1 Measurement view Pixel resolution *1
10× 1× 10× 700μmx520μm 0.345um 640umx512um 2um
20× 1× 20× 350umx260um 0.173um 320umx256um 1um
50× 1× 50× 140umx100um 0.069um 128umx102.4um 0.4um
100× 1× 100× 70umx50um 0.035um 64umx51.2um 0.2um
(Option) With 2× intermediate lens port
10× 2× 20× 350umx260um 0.173um 320umx256um 1um
20× 2× 40× 175umx130um 0.0865um 160umx128um 0.5um
50× 2× 100× 70umx50um 0.035um 64umx51.2um 0.2um
100× 2× 200× 35umx25m 0.0175um 32umx25.6um 0.1um
【Detector Selection】InGaAs High Resolution NIR Detector ISA041HRA（SXGA）/ISA041HRVA（VGA）
Imaging Detector InGaAs High Resolution NIR Detector
ISA041HRA (SXGA type)		 InGaAs High Resolution NIR Detector
ISA041HRVA (VGA type)
Spectral range 400-1700nm 400-1700nm
Effective pixels number 1280×1024 pixels 640×512 pixels
Pixel pitch 5μm 5μm
Sensor format 6.4mm×5.12mm（1/2"） 3.2mm×2.56mm（1/4"）
Objective lens Intermediate lens Total magnification Measurement view Pixel resolution*1 Measurement view Pixel resolution*1
10× 1× 10× 640μm×512μm 0.5um 320umx256um 0.5μm
20× 1× 20× 320um×256um 0.25um 160um×128um 0.25um
50× 1× 50× 128um×102.4um 0.1um 64um×51.2um 0.1um
100× 1× 100× 64um×51.2um 0.05um 32um×25.6um 0.05um
（Option）With 2× intermediate lens port MS-OP011-RL2
10× 2× 20× 320um×256um 0.25um 160um×128um 0.25um
20× 2× 40× 160um×128um 0.125um 80um×64um 0.125um
50× 2× 100× 64um×51.2um 0.05um 32um×25.6um 0.05um
100× 2× 200× 32um×25.6m 0.025um 16um×12.8um 0.025um
  • *1 Pixel Resolution：Calculated value by (View)/(effective pixels number), means length equivalent to 1 pixel of image sensor.
  • These values shown above are approximate values calculated from image sensor size and sensor pitch.

SIMPLE STRUCTURE OF SOPHISTICATED NFP MEASUREMENT OPTICS M-Scope type S

The measurement light emitted from the sample is magnified by the first-stage objective lens and imaged on the image detector at the latter stage of the optical system by the imaging lens. The captured images are processed on a PC and analyzed for the emission beam profile, beam width, power distribution, etc. of the sample.

COMPONENT

STANDARD COMPONENT
  • M-Scope type S（optics unit, manual revolver）） 1set
  • Base plate for optics : 1set
OPTION
  • Intermediate lens port
    • 2× Intermediate Port MS-OP011-RL2
      • Intermediate lens unit that doubles the overall magnification of the optical system. (up to 200× with 100× objective lens）
    • 1/2× Intermediate Port MS-OP011-RLH
      • Intermediate lens unit that halves the overall magnification of the optical system.
  • Detector selection
  • Objective lens
    • M-Plan Apo series
    • About objective lens, please refer to here.
  • Neutral density filter
    • About neutral density filters, please refer to here.
  • Coaxial Epi-illumination Port MS-OP011-CEP
    • Coaxial epi-illumination port with removable half mirror.
  • Coaxial Epi-illumination Light Source
    • About coaxial epi-illumination light source, please refer to here.
  • Optics workbench for sample measurement
    • Optics Bench For Fiber Measurement OP002-F3/OP002-F5
    • Vertical Type Optics Bench OP002
      • About optics workbench, please refer to here.

OUTSIDE DIMENSIONS

OUTSIDE DIMENSIONS OF M-Scope type S
  • Outside dimensions above is reference values. These values change as equipped option and detector. Please ask the drawing data in details if necessary.

RELATED PRODUCTS INFORMATION

SYSTEM SOLUTION / DATA PROCESSING AND ANALYSIS SYSTEM
OTHER OPTICS FOR OPTICAL MEASUREMENT

CATALOG DOWNLOAD