IMAGING DETECTOR AND RELATED PRODUCT
InGaAs HIGH SENSITIVITY SWIR DETECTOR ISA041H2
PRODUCT OVERVIEW
InGaAs HIGH SENSITIVITY SWIR DETECTOR ISA041H2
ISA041H2 is a new type InGaAs SWIR detector using 320×256 pixels InGaAs solid state image sensor, having high spectral sensitivity in 950~1700nm spectral range.
Especially, it has very high spectral sensitivity in 1300~1600nm SWIR spectral range, so it is best for beam profile measurement and analysis, beam observation, inspection, assembling adjustment of various optical device and module for optical communication.
As the image sensing device, InGaAs solid state image sensor is used. It has good characteristics in optical input-output linearity, durability to the input light, and free from image lag.
In combination with Synos’ optical system M-Scope series and Optical Beam Analysis Module AP013, it realizes various optical beam observation and analysis system in NIR spectral range.
FEATURE
- High sensitivity InGaAs SWIR image sensor
- 320(H)×256(V) total pixels, 20um × 20um pixel size, 10℃ chip temperature control
- High spectral sensitivity in 950~1700nm SWIR spectral range.
- Superior characteristic of optical input-output linearity
- ISA041H2 has nearly linear signal output characteristic to optical input, therefore it is very suitable for optical intensity distribution measurement for laser beam measurement.
- Excellent durability to input light, superior property for image lag.
- ISA041H2 has almost no image lag, which makes it suitable for observation of quick movements such as position alignment and surveillance. In addition, it has almost no image burning that conventional infrared vidicon camera has.
- Easy set-up by using USB I/F
- ISA041H2 has USB3.0 I/F as camera I/F. It is easy to set up and use without special image processing hardware.
APPLICATIONS
- Laser beam observation and laser beam profile analysis in 950~1700nm SWIR spectral range.
- Laser diode, optical fiber, optical waveguide, optical modules for optical communication
- NFP, FFP, collimated beam measurement in 950~1700nm spectral range
- Optical characteristic measurement and assembly alignment for optical communication module such as fiber module and optical module
- Research and development of silicon photonics
- Inspection for semiconductor devices
- Si wafer, compound semiconductor wafer, solar cell device, semiconductor chip
- Image observation in SWIR range in general purpose
SUMMARY OF SPECIFICATION
SPECTRAL SENSITIVITY
SUMMERY OF SPECIFICATION
MAIN SPECIFICATIONS OF InGaAs SENSOR | |
---|---|
Sensor | InGaAs image sensor (10℃ chip temperature control) |
Spectral range | 950~1700nm |
Pixel number | 320(H)×256(V) (total 81920 pixels) |
Sensor pitch (pixel size) | 20μm × 20μm |
Effective device size | 6.4mm(H) × 5.12mm(V) |
MAIN SPECIFICATIONS OF DETECTOR UNIT | |
Camera interface | USB3.0 |
ADC | 14bit |
Chip cooling temperature | 10℃ +- 0.5℃ (at ambient temperature 25℃, forced-air cooling) |
Exposure time | 4.6ms ~ 1s (rolling shutter mode) |
100μs ~ 1s (global shutter mode) | |
Frame rate | 216.6 frames/sec (rolling shutter mode) |
214.3 frames/sec (global shutter mode) | |
Camera mount | C mount |
Power consumption | 16W or less |
Input voltage | DC +12V |
Ambient operation temp. (recommended) | +25℃ +-3℃ |
Ambient operation temperature/humidity | 0~40℃ / 30%~80% (no condensation) |
Ambient storage temperature/humidity | -10~+50℃ / under 90% (no condensation) |
COMPONENT
STANDARD COMPONENT
- Detector head : 1
- Dedicated AC adaptor : 1