OPTICAL MEASUREMENT SYSTEM SOLUTION
FFP MEASUREMENT SYSTEM
PRODUCT OVERVIEW
FFP MEASUREMENT SYSTEM
FFP (Far Field Pattern) measurement and analysis system by dedicated FFP measurement optics and image processing method. This system will be widely applicable to FFP analysis of optical devices, optical modules such as laser diodes, optical fibers, OPCB waveguides, etc.
Synos’ FFP Measurement Optics M-Scope type F is adopted in this system. In combination with M-Scope type F, imagimg detector and Synos' Optical Beam Analysis Module AP013, it is widely applicable for FFP, N.A. measurement and analysis of various optical devices, modules, components.
By selecting imaging detectors, it will be applicable for optical beam profile observation and analysis in 400~1700nm spectral range.
FEATURE
- Synos’ M-Scope type F, FFP Measurement Optics, is adopted as FFP measurement optics
- Realtime measurement and analysis of FFP by dedicated optics and image processing method
- Long W.D. of approx. 6mm.
- Possible to select suitable imaging detector from 400~1700nm spectral range
- for 400~1100nm : High Resolution CMOS Detector ISA071/ISA071GL
- for 950nm~1700nm : InGaAs High Sensitivity NIR Detector ISA041H2
- 【NEW】for 400nm~1700nm : SXGA InGaAs High Resolution NIR Detector ISA041HRA
- Synos' Optical Beam Analysis Module AP013, image processing, data aquisition and analysis system for optical beam analysis.
- All-in-one package system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, sensor driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
- Optometrics BA Standard, specially designed high-functional image processing software for optical beam profile analysis
- Essential and useful functionality for NFP, FFP, beam profile analysis are equipped in Optometrics BA Standard.
- EF/EAF analysis function is installed as standard function.
APPLICATION
- FFP measurement and analysis of various light emitted device such as laser, laser diode, etc.
- FFP and N.A. measurement and analysis of various optical fibers
- SMF, MMF, POF etc.
- FFP and N.A. measurement and analysis of waveguide modules
- Polymer waveguides for OPCB, etc.
- Si photonics waveguides, etc.
- Waneguide type optical modules
- Encircled Angular flux analysis of various SI-MMF
- Assembling adjustment between various optical module and micro lens module
SYSTEM COMPONENT SELECTION
SYSTEM CONFIGURATION DIAGRAM
COMPONENT SELECTION
- FFP Measurement Optics M-Scope type F selection
- for 650~1700nm : M-Scope type F
- for 400~650nm : M-Scope type F/BL
- 【Special model】High Resolution FFP Measurement Optics For NIR Range M-Scope type FHR
- This optics is the infrared high-resolution model dedicated to 1310~1550nm spectral range. Only VGA type InGaAs High Sensitivity NIR Detector ISA041VH can be used as the detector for M-Scope type FHR.
- Detector selection
- 400~1100nm: High Resolution CMOS Detector ISA071/ISA071GL
- 950~1700nm: InGaAs High Sensitivity NIR Detector ISA041H2
- 400~1700nm: 【NEW】InGaAs High Resolution NIR Detector ISA041HRA
- About optical sensor selection, please refer to here.
- Optical Beam Analysis Module AP013
- Personal Computer for data processing
- Optical beam analysis software Optometrics BA Standard
- Calibration data set for NFP measurement
- Driver software for imaging detector
- Accessories
- Cables
- Documents (instruction manuals, etc.)