OPTICAL MEASUREMENT SYSTEM SOLUTION
OPTICAL BEAM NFP MEASUREMENT SYSTEM FOR HIGH POWER LASER
PRODUCT OVERVIEW
OPTICAL BEAM NFP MEASUREMENT SYSTEM FOR HIGH POWER LASER
Optical Beam NFP Measurement System For High Power Laser is optimized especially for optical beam profile measurement of output ~10W class high power laser .
Synos’ M-Scope type HL, NFP Measurement Optics For High Power Laser, is adopted as NFP measurement optics in this system. In combination with M-Scope type HL, imaging detector and image processing system, it is widely applicable for NFP and optical beam observation, measurement and analysis of high power laser and related module, component.
This system is ideal for laser beam profiler for output ~10W class high power laser in 400~1100nm spectral range.
NOTE) One wavelength must be selected from this spectral range for the measurement wavelength.
FEATURE
- Synos’ M-Scope type HL, NFP Measurement Optics For High Power Laser, is adopted as NFP measurement optics
- Beam sampler before objective lens and ND filter for attenuation of high power laser
- Measurable spectral range corresponds to 400nm~1100nm
- One wavelength of the measurement target must be selected in 400~1100nm spectral range for the measurement wavelength.
- Detector selection
- for 400~1100nm : High Resolution CMOS Detector ISA071/ISA071GL
- Synos' Optical Beam Analysis Module AP013, image processing, data aquisition and analysis system for optical beam analysis.
- All-in-one package system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, sensor driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
- Optometrics BA Standard, specially designed high-functional image processing software for optical beam profile analysis
- Essential and useful functionality for NFP, FFP, beam profile analysis are equipped in Optometrics BA Standard.
- EF/EAF analysis function is installed as standard function.
APPLICATION
- Laser beam profiler, NFP (optical beam profile) measurement of output ~10W class high power laser and related optical module
- Beam profile measurement of high power laser for biometric authentication, Automotive application, illumination, laser machining, medical, solid laser excitation, printing, etc.
- Beam profile measurement of various high power lasers in general
SYSTEM COMPONENT SELECTION
SYSTEM CONFIGURATION DIAGRAM
COMPONENT SELECTION
- Optics
- NFP Measurement Optics For High Power Laser M-Scope type HL
- 10x objective lens (monocular), beam sampler unit, camera port, coaxial epi-illumination port, filter port
- 【Note】It is necessary to specify one measurement wavelength within the wavelength range of 400nm to 1100nm
- Detector
- 400~1100nm：High Resolution CMOS Detector ISA071/ISA071GL
- Optical Beam Analysis Module AP013
- Personal Computer for data processing
- Optical beam analysis software Optometrics BA Standard
- Calibration data set for NFP measurement
- Driver software for imaging detector
- Accessories
- Cables
- Documents (instruction manuals, etc.)
OPTIONAL UNITS・ACCESSORIES SELECTION
- Option for M-Scope type HL
- 2× Intermediate Lens Port MS-OP011-RL2
- Intermediate lens unit that doubles the overall magnification of the optical system. (up to 200× with 100× objective lens）
- 1/2× Intermediate Lens Port MS-OP011-RLH
- Intermediate lens unit that halves the overall magnification of the optical system.
- Coaxial Epi-illumination Port MS-OP011-CEP
- Coaxial epi-illumination port with removable half mirror.
- About optional units for M-Scope type HL in details, please refer to here.
- ND filter
- for visible（400~700nm）：NDF-5
- for NIR（700nm~1100nm）：NDF NIR-5
- Coaxial epi-illumination system
- About coaxial epi-illumination system, refer to here.
- Optics base and workbench
- Optics bench for optical fiber measurement
- Vertical type optics bench
- About optics base and workbench, please refer to here.