OPTICAL MEASUREMENT SYSTEM SOLUTION
FFP MEASUREMENT SYSTEM FOR HIGH POWER LASER
PRODUCT OVERVIEW
FFP MEASUREMENT SYSTEM FOR HIGH POWER LASER
FFP Measurement System For High Power Laser is the optical method FFP(Far Field pattern) measurement system of output ~10 W class high power laser.
As the measurement optics, Synos' FFP Measurement Optics For High Power Laser M-Scope type HF is used. M-Scope type HF is the optics for measuring FFP(Far-Field Pattern) of output ~10W class high power laser, with a luminous flux diameter coverage of about 3mmφ. By using this optics, it has become possible to cope with FFP measurement and emission N.A. measurements of high power laser such as laser elements with large light emitting area, array type light emitting elements, and large core fibers.
In combination with M-Scope type HF, 1" high resolution CMOS detector ISA061, and Optical Beam Analysis Module AP013, it will be possible to easily build FFP measurement system for various high power laser devices.
FEATURE
- Synos’ FFP Measurement Optics For High Power Laser M-Scope type HF
- Optics selection
- for 850~940nm : FFP Measurement Optics For High Power Laser M-Scope type HF/NIR
- *Please contact us for another measurement wavelength
- Specially designed optics for realtime FFP(Far Field Pattern) observation and analysis for output ~10W class high power laser
- Wide area design with measurement diameter coverage of approx. 3mmφ
- Measurement angle coverage of approx. ±43°
- Detector
- for 400~1100nm : 1" High Resolution CMOS Detector ISA061 (designated)
- Synos' Optical Beam Analysis Module AP013, image processing, data aquisition and analysis system for optical beam analysis.
- All-in-one package system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, sensor driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
- Optometrics BA Standard, specially designed high-functional image processing software for optical beam profile analysis
- Essential and useful functionality for NFP, FFP, beam profile analysis are equipped in Optometrics BA Standard.
- EF/EAF analysis function is installed as standard function.
APPLICATION
- Beam divergence (FFP) measurement of output ~10W class high power laser device and module
- Development of automotive optoelectronic components and systems such as LiDAR, laser headlight, etc.
- Development of laser module for biometric authentication
- FFP/beam divergence measurement and analysis of highpower laser and high power laser module for medical use, display device, various electronics device, solid-state laser excitation, printing, etc.
SYSTEM COMPONENT SELECTION
SYSTEM CONFIGURATION DIAGRAM
COMPONENT SELECTION
- Optics selection
- for 850~940nm : FFP Measurement Optics For High Power Laser M-Scope type HF/NIR
- Please contact us for other measurement wavelengths.
- Detector
- for 400~1100nm : 1" High Resolution CMOS Detector ISA061 (designated)
- Optical Beam Analysis Module AP013
- Personal Computer for data processing
- Optical beam analysis software Optometrics BA Standard
- Calibration data set for NFP measurement
- Driver software for imaging detector
- Accessories
- Cables
- Documents (instruction manuals, etc.)
OPTIONAL UNITS・ACCESSORIES SELECTION
- ND filter (designated 35mmφ)
- for 850nm~940nm ：NDF NIR35-5 (10%, 5%, 1%, 0.1%, 0.01%)
- Optics base and workbench
- Optics bench for optical fiber measurement
- Vertical type optics bench
- About optics base and workbench, please refer to here.