HIGH-PERFORMANCE OPTICAL MEASUREMENT EQUIPMENT AND SYSTEM SOLUTION

OPTICS AND OPTICAL MEASUREMENT INSTRUMENTS

NFP MEASUREMENT OPTICS FOR HIGH POWER LASER M-Scope type HL

PRODUCT OVERVIEW

mscopetypehl

M-Scope type HL is the NFP measurement optics that is optimized especially for laser beam profiler of output ~10W class high power laser.

Approximately 5% of the optical beam emitted from sample is reflected by a beam sampler. Reflected beam is introduced to imaging detector through the NFP optics. By this way, beam profile of high power laser is analyzed precisely.

In combination with Synos’ Optical Beam Analysis Module AP013, it is easy to build up laser beam profiler system and NFP measurement system for output ~10W class high power laser.

FEATURE

  • Optical beam power is attenuated to appropriate level for beam profile measurement by beam sampler unit installed in front of the objective lens and ND filters.
  • Optical magnification is 10x (standard), maximum 20x (option, in combination with 10x objective lens and optional 2x intermediate lens).
  • In combination with epi-illumination port and light source (option), it is possible to adjust and align measurement positions by observing microscopic image.
  • In combination with Synos’ Optical Beam Analysis Module AP013, it is easy to build up an NFP measurement system for high power lasers.

APPLICATION

  • NFP&laser beam profile measurement of output ~10W class high power laser devices and modules
  • Development of automotive optoelectronic components and systems such as LiDAR, laser headlight, etc.
  • Development of laser modules for biometric authentication
  • NFP & laser beam profile measurement and analysis of highpower lasers and high power laser modules for medical use, display devices, various electronics devices, solid-state laser excitation, printing, etc.

SUMMARY OF SPECIFICATION

MAIN SPECIFICATION OF THE OPTICS
Measurement method NFP measurement optics with one-stage beam sampler & image processing and analysis method.
Measurement wavelength Specify the measurement wavelength within 400nm ~1100nm wavelength range
Measurement target input power approx. ~10W (negosiable)
Optical attenuation method Attenuate to approx. 5% of input power by one-stage beam sampler unit (in front of the objective lens), and fine-tune by ND filter
Objective lens magnifiction 10×
N.A. 0.28
Intermediate lens 1x (standard), 2x (option)
Total magnification
  • Standard :10x (with 10x objective lens)
  • Option :20x (Using optional 2x intermediate magnification lens and objective lens with 10x)
Field of view
  • Standard : approx. 706×529μm (total magnification 10×, using 10x objective lens and Synos’ High Resolution CMOS detector ISA071/ISA071GL)
  • Option :approx. 353μm×264μm(total magnification 20×, using 10× objective lens, optional 2x intermediate lens, Synos’ High Resolution CMOS detector ISA071/ISA071GL)
Pixel resolution
  • Standard :approx. 0.345μm (total magnification 10×, using 10x objective lens and Synos’ High Resolution CMOS detector ISA071/ISA071GL)
  • Option :approx. 0.17μm (total magnification 20×, using 10× objective lens, optional 2x intermediate lens, Synos’ High Resolution CMOS detector ISA071/ISA071GL)
Coaxial epi-illumination Option
Camera mount C mount

COMPONENT

STANDARD COMPONENT
  • M-Scope type HL(optics unit, 10× objective lens, one-stage beam sampler unit) : 1set
  • Base plate for optics : 1set
Option
  • Intermediate lens port
    • 2× Intermediate Port MS-OP011-RL2
      • Intermediate lens unit that doubles the overall magnification of the optical system. (up to 200× with 100× objective lens)
    • 1/2× Intermediate Port MS-OP011-RLH
      • Intermediate lens unit that halves the overall magnification of the optical system.
  • Coaxial Epi-illumination Port MS-OP011-CEP
    • Coaxial epi-illumination port with removable half mirror.
  • Detector
  • Neutral density filter
    • About neutral density filters, please refer to here.
  • Optics workbench for sample measurement
    • Optics Bench For Fiber Measurement OP002-F3/OP002-F5
    • Vertical Type Optics Bench OP002
      • About optics workbench, please refer to here.

RELATED PRODUCTS INFORMATION

SYSTEM SOLUTION / DATA PROCESSING AND ANALYSIS SYSTEM
  • NFP Measurement System For High Power Laser
    • Optical beam NFP measurement and analysis system for high power laser devices, in combination with High Power Laser NFP Measurement Optics M-Scope type HL and Optical Beam Analysis Module AP013.
  • Optical Beam Analysis Module AP013
    • Data acquisition and analysis system for optical beam analysis. AP013 is composed of a personal computer for data acquisition and data analysis, SYNOS' Optical Beam Analysis Software Optometrics BA Standard, camera driver software, and calibration data set.
OTHER OPTICS FOR OPTICAL MEASUREMENT

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