OPTICAL MEASUREMENT SYSTEM SOLUTION
WIDE AREA FFP MEASUREMENT SYSTEM
PRODUCT OVERVIEW
WIDE AREA FFP MEASUREMENT SYSTEM
Wide Area FFP Measurement System is the FFP(Far Field pattern) measurement system with a luminous flux diameter coverage of about φ3mm.
As the measurement optics, Synos' Wide Area FFP Measurement Optics M-Scope type FW is used. M-Scope type FW is the optics for measuring FFP(Far-Field Pattern) with a luminous flux diameter coverage of about 3mmφ. By using this optics, it has become possible to cope with FFP measurement and emission N.A. measurements such as laser elements with large light emitting area, array type light emitting elements, and large core fibers.
In combination with detector and Optical Beam Analysis Module AP013, it can be used for FFP measurement and analysis of various optical devices with large light emitting area.
FEATURE
- Synos’ Wide Area FFP Measurement Optics M-Scope type FW is adopted as measurement optics
- Specially designed optics for realtime FFP(Far Field Pattern) observation and analysis
- Wide area type with measurement light flux diameter coverage of approx. 3mmφ
- Wide area type with measurement angle coverage of approx. ±43°
- Long working distance of approx.4mm±0.4mm
- Possible to select suitable imaging detector from 400~1700nm spectral range
- for 400~1100nm : 1" High Resolution CMOS Detector ISA061(designated)
- for 950nm~1700nm : VGA Type InGaAs High Sensitivity NIR Detector ISA041VH(designated)
- Synos' Optical Beam Analysis Module AP013, image processing, data aquisition and analysis system for optical beam analysis.
- All-in-one package system with PC for data processing, Optical Beam Analysis Software Optometrics BA Standard, sensor driver software, calibration data set for data analysis. Possible to start up measurement system quickly after system introduction.
- Optometrics BA Standard, specially designed high-functional image processing software for optical beam profile analysis
- Essential and useful functionality for NFP, FFP, beam profile analysis are equipped in Optometrics BA Standard.
- EF/EAF analysis function is installed as standard function.
APPLICATION
- FFP, N.A. measurement of large emission area laser element, array type laser element, etc.
- FFP, N.A. measurement of large core optical fiber
- FFP, N.A. measurement of various optical modules such as lens module, etc.
- Encircled Angular flux analysis of various SI-MMF
SYSTEM COMPONENT SELECTION
SYSTEM CONFIGURATION DIAGRAM
COMPONENT SELECTION
- Wide Area FFP Measurement Optics M-Scope type FW selection
- for 650~1700nm : M-Scope type FW
- for 400~650nm : M-Scope type FW/BL
- Detector selection
- 400~1100nm: 1" High Resolution CMOS Detector ISA061(designated)
- 950~1700nm: VGA Type InGaAs High Sensitivity NIR Detector ISA041VH(designated)
- About optical sensor selection, please refer to here.
- Optical Beam Analysis Module AP013
- Personal Computer for data processing
- Optical beam analysis software Optometrics BA Standard
- Calibration data set for NFP measurement
- Driver software for imaging detector
- Accessories
- Cables
- Documents (instruction manuals, etc.)
OPTIONAL UNITS・ACCESSORIES SELECTION
- 35mmφ ND filter (designated)
- for visible（400~700nm）：NDF 35-5
- for NIR（700nm~1100nm）：NDF NIR35-5
- for IR（1310nm~1550nm）：NDF IR35-5
- About ND filter, please refer to here.
- Optics base and workbench
- Optics bench for optical fiber measurement
- Vertical type optics bench
- About optics base and workbench, please refer to here.