OPTICS AND OPTICAL MEASUREMENT INSTRUMENTS
FFP MEASUREMENT OPTICS FOR HIGH POWER LASER M-Scope type HF
PRODUCT OVERVIEW
M-Scope type HF is the optics for measuring FFP(Far Field Pattern) of output ~10 W class high power lasers. The combination of dedicated optics, imaging detector and image processing method enables realtime acquisition and measurement of FFP (Far Field Patterd), radiation angle of the outgoing beam from high power laser modules.
By expanding the measurement target beam diameter to approx. 3 mmφ, it has become possible to cope with FFP measurement and emission N.A. measurements such as laser elements with large light emitting area, array type light emitting elements, and large core fibers.
It is possible to easily build FFP measurement system for high power laser, in combination with SYNOS' Optical Beam Analysis Module AP013. In addition, it is also possible to support optical power distribution analysis.
FEATURE
- Specially designed optics for realtime FFP (Far Field Pattern) observation and analysis for output ~10W class high power lasers
- Attenuate the output power of high power laser to appropriate level that can be measured by combining the two stage beam sampler and ND filters
- Wide area design with measurement diameter coverage of about 3mmφ, measurement angle coverage of about ± 43°
- Realtime measurement by dedicated FFP measurement optics for high power laser and image processing method
- Long workin distance design of approx.
- In combination with SYNOS' Optical Beam Analysis Module AP013, it is possible to easily build FFP measurement and analysis system for high power laser including optical power distribution analysis function.
APPLICATION
- FFP, N.A. measurement of output ~10W class high power laser devices and modules
- Development of automotive optoelectronic components and systems such as LiDAR, laser headlight, etc.
- Development of laser modules for biometric authentication
- FFP/N.A. measurement and analysis of highpower lasers and high power laser modules for medical use, display devices, various electronics devices, solid-state laser excitation, printing, etc.
SUMMARY OF SPECIFICATION
MAIN SPECIFICATION OF THE OPTICS
Measurement Method | Dedicated f-θ optics for high power laser and image processing/analysis method | ||
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Measurement target input power | ~10W (negosiable) | ||
Measurement target light flux diameter | approx. 3mmφ | ||
Measurement target wavelength range |
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Polarization dependent compensation | Compensated by 2-stage orthogonal arrangement of attenuation mirrors built in the beam sampler | ||
Working distance | approx. 4mm±0.4mm(depend on the measurement sample size) | ||
Optical attenuation method | Attenuate to about 99.99% of input power by the two-stage beam sampler unit (behind the objective lens), and fine-tune by ND filter | φ35mm ND filter | |
Camera mount | C mount | ||
Detector | Detector (dedicated) | 1" High Resolution CMOS Detector ISA061 | |
Sensor | 1" progressive scan CMOS sensor | ||
Effective pixels number | 2048×2048 pixels | ||
Pixel pitch | 5.5×5.5μm | ||
A/D converter | 12bit | ||
PC I/F | Gigabit Ethernet(GigE Vision) | ||
Measurement Specification | Measurement angle coverage | approx. ±43° | using ISA061 |
Pixel resolution | approx. 0.05° | using ISA061 |
COMPONENT
STANDARD COMPONENT
- M-Scope type HF (optics unit, 2-stage beam sampler, beam damper) : 1set
- Base plate for optics : 1set
OPTION
- DETECTOR
- 1" High Resolution CMOS Detector ISA061
- About imaging detector selection, please refer to here.
- Neutral density filter
- φ35mm ND filter set (dedicated)
- φ35mm ND Filter Set NDF NIR35-5 (for NIR spectral range)
- About neutral density filters, please refer to here.
- Optics workbench for sample measurement
- Optics Bench For Fiber Measurement OP002-F3/OP002-F5
- Vertical Type Optics Bench OP002
- About optics workbench, please refer to here.
OUTSIDE DIMENSIONS
OUTSIDE DIMENSIONS OF M-Scope type HF
- Outside dimensions above is reference values. These values change as equipped option and detector. Please ask the drawing data in details if necessary.