OPTICAL MEASUREMENT & INSPECTION SYSTEM / PRODUCT HEADLINE

SYNOS is developing various optical measurement and inspection system solution for various optical measurement application, making a best combination of our unique optics, optical sensor, mechanical system and software technology.

Optical device and optical component are widely embedded and applied for various electronics products as prevailing technology. We propose various optical measurement, inspection, evaluation system for optical characteristic of various optical device such as light emitting device, light receiving device, optical fiber, various waveguide module and other optical components for optical communication system.

OPTICAL MEASUREMENT & INSPECTION SYSTEM / NEWS&TOPICS

NEW
2016/4/1
<RELEASE NEWS> SYNOS released <HIGH POWER LASER NFP(Near Field Pattern) MEASUREMENT SYSTEM on April 2016. System is composed of Synos' High power laser NFP measurement optics/M-Scope type H and optical beam analysis module, Synos' original image processing and analysis system. It will be widely applicable to beam profile measurement of various high power laser devices and modules for laser headlight, laser machining, medical, solid laser excitation, pronting, etc. High power laser NFP measurement system
2015/10/10 PDF catalog (download) becomes available. Please download from each product page or from sales information > catalog download page.  
2015/4/8 Optical method insertion loss measurement system targeting on micro structural waveguide device using Synos' optical beam irradiation and detection measurement optics / M-Scope type J/PF. It is possible to execute high speed and efficient insertion loss measurement of micro structural waveguide device such as silicon photonics waveguide device, near-field optical device and so on. Optical mocrostructural waveguide insertion loss measurement system
2014/11/1

INFORMATION
International standard of enciecled flux / enceicled angular flux measurement method
*Encircled Flux measurement method : IEC61280-1-4
*Enciecled Angular Flux measurement method : IEC61330-3053

EF/EAF measurement system
2014/4/8 Quick and accurate optical continuity tester for multi-channel polymer waveguide for OPCB substrate with automatic sample loader/unloader system. By automatic sample loader/unloader system for separate waveguide module, it is possible to shorten time to set separate OPCB sample onto the measurement sample holder, and improve testing efficiency greatly. Optical continuity tester with sample loading / unloading system

OPTICAL MEASUREMENT & INSPECTION SYSTEM / LINEUP AND PRODUCT OUTLINE

GENERAL-PURPOSE OPTICAL MEASUREMENT AND INSPECTION SYSTEM

Optical Beam NFP (Near Field Pattern) Measurement System Optical beam pattern measurement and analysis system in combination with NFP measurement optics & Optical Beam Analysis Module AP013. Best for beam pattern evaluation of various optical device, optical module, optical component.
  • Optical beam NFP/beam profile observation and analysis of LD, fiber, waveguide and various optical device
  • Evaluation, assembling adjustment of various optical module
Optical Beam FFP (Far Field Pattern) Measurement system Optical beam pattern measurement and analysis system in combination with FFP measurement optics & Optical Beam Analysis Module AP013. Best for FFP (far field pattern), N.A. evaluation of various optical device, optical module, optical component.
  • Measurement of FFP (spread angle) of laser device, optical fiber and so on
  • Measurement of N.A. for optical fiber, optical waveguide and so on
EF (Encircled Flux) / EAF (Encircled Angular Flux) Measurement System Rapid measurement and evaluation system for EF (Encircled Flux) and EAF (Encircled Angular Flux) analysis of multi-mode optical fiber by NFP/FFP measurement optics & Optical Beam Analysis Module AP013.
  • Evaluation and analysis of Encircled Flux (EF) for GI-MMF, waveguide etc.
  • Evaluation and analysis of Encircled Angular Flux (EAF) for SI-MMF, POF and waveguide etc.
Collimated Beam Measurement System Collimated beam pattern measurement and analysis system in combination with collimated beam measurement optics & Optical Beam Analysis Module AP013. Best for collimate lens alignment of various optical collimator devices and modules.
  • Evaluation of collimated beam quality
  • Alignment, assembling adjustment of various collimator modules
  • Alignment, assembling adjustment of 1st lens(collimator lens) in batterfly module
NFP/FFP Simultaneous Measurement System
NFP/Collimated Beam Simultaneous Measurement System
Realize simultaneous measurement of NFP & FFP/collimated beam by a single optical unit. Possible to measure NFP pattern and radiation angle, N.A. / collimated beam condition at once.
  • NFP/FFP (Collimated beam) evaluation of optical device, optical fiber, optical waveguide module and so on
  • Alignment, assembling adjustment of various collimator modules
  • Alignment, assembling adjustment of batterfly module and so on.
<NEW>
High Power Laser NFP Measurement System
High power laser NFP measurement system, mainly targeting on 5W class high power laser device and module. System is composed of Synos' high power laser NFP measurement optics/M-Scope type H and optical beam analysis module, Synos' original image processing and analysis system.
  • Beam profile measurement and analysis of various high power laser devices and modules for laser headlight, laser machining, medical, solid laser excitation, pronting, etc.
Optical Beam Analysis Module Having EF/EAF Analysis Function
AP013
Image prosessing and data analysis system focusing on optical beam profile measurement and analysis, widely applicable to optical beam profile measurement application in combination with Synos’optical system, M-Scope series and optical detectors.
  • Optical beam profile and intensity analysis in general
  • NFP/FFP/collimated beam analysis
  • EF(Encircled Flux), EAF(Encircled Angular Flux) analysis

APPLICATION-SPECIFIC OPTICAL MEASUREMENT AND INSPECTION SYSTEM

Optical Continuity Tester for Polymer Waveguide Module High speed and high accuracy continuity test system for multi-channel polymer optical waveguide module. Optical continuity check system for mass production inspection compliant.
  • High speed continuity test in mass production of polymer waveguide (relative loss measurement method in comparison with reference waveguide channel)
  • Core position, core pitch, core external shape measurement of polymer waveguide etc.
Optical Continuity Tester With Sample Loading/Unloading System Quick and accurate optical continuity tester for multi-channel polymer waveguide module for optical interconnection with automatic sample loader/unloader system.
  • High speed continuity test in mass production of polymer waveguide (relative loss measurement method in comparison with reference waveguide channel)
  • Core position, core pitch, core external shape measurement of polymer waveguide etc.
Insertion Loss Measurement System With Optical Method for Polymer Waveguide Module Optical method insertion loss measurement system of polymer optical waveguide quickly as it observes the image of core edge and detect the measurement light with direct radiation and detection in combination with SYNOS' M-Scope type M and manual/motorized stage system.
  • Manual/semi-automatic/automatic insertion loss measurement mainly for polymer optical waveguide module

High Resolution Insertion Loss Measurement System With Optical Method for Ultra Fine Structual Waveguide Module

Optical method insertion loss measurement system, targeting on high resolution measurement of ultra fine structual waveguide module such as Si-photonics waveguide, near field optical device, and so on. Quick measurement by direct radiation and detection of measurment light in combination with SYNOS' M-Scope type J and manual/motorized stage system.
  • Manual/semi-automatic/automatic insertion loss measurement mainly for ultra fine waveguide such as Si-photonics waveguide, nearfield optical device and so on.
Wafer Level Optical Characteristic Measurement System For Optical Device Wafer-level testing of optical characteristic for various light emitting device and lighr receiving device in combination with manual / semi-automatic prober system.
  • Wafer level optcial characteristic measurement for light receiving device such as PD, optical sensor.
  • Wafer level optcial characteristic measurement for light smmiting device such as VCSEL, LED and so on.